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D. Sayre, M. Howells, J. Kirz, M. Rarback (eds). X‐Ray microscopy II. Springer Series in Optical Sciences, Vol. 56. Springer‐Verlag, Berlin Heidelberg, New York, London, Paris, Tokyo 1988, 454 pages, 306 figures, DM 114,–, ISBN 3‐540‐19‐392‐8
Author(s) -
Förster E.
Publication year - 1989
Publication title -
crystal research and technology
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170240707
Subject(s) - library science , citation , computer science