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Vickers indentation hardness of Hg 1− x Cd x Te
Author(s) -
Fissel A.,
Schenk M.,
Engel A.
Publication year - 1989
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170240514
Subject(s) - indentation , crystallite , vickers hardness test , indentation hardness , monocrystalline silicon , materials science , hardening (computing) , crystallography , knoop hardness test , solid solution , metallurgy , composite material , analytical chemistry (journal) , chemistry , microstructure , silicon , layer (electronics) , chromatography
The Vickers indentation hardness of Hg 1− x Cd x Te has been measured as a function of composition x using monocrystalline samples of Bridgman and THM crystals and polycrystalline starting material at room temperature. The microhardness varied between 220 MPa ( x =0) and 440 MPa ( x =1), showing a maximum of 850 MPa at x ∼ 0.75, and was different between monocrystalline and polycrystalline samples. The “hardening rate” dH/dx is strongly dependent on the composition range and is discussed in context with solid solution hardening due to elastic interactions of solute atoms with gliding dislocations and ordering effects.