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An X‐ray diffraction refinement of the crystal structure of natural tetragonal analcime (NaAlSi 2 O 6 . H 2 O)
Author(s) -
Pechar F.
Publication year - 1989
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170240510
Subject(s) - analcime , tetragonal crystal system , crystallography , crystal structure , diffraction , materials science , x ray crystallography , tetrahedron , crystal (programming language) , chemistry , physics , optics , zeolite , computer science , biochemistry , catalysis , programming language
An X‐ray diffraction analysis was performed on a single crystal of natural tetragonal analcime: (Na 0.99 K 0.01 )/(Al 1.05 Si 2.02 ) O 6 /0.99 H 2 O, space group I 4 1 /acd, a = 13.726(2) Å, c = 13.684(1) Å, V = 2578.1 Å 3 , Z = 16, D obs = 2.26. Refinement of 260 independent reflections yields R = 0.028 ( R w = 0.033). The mean Si(Al)O distance is 1.636 Å and tetrahedral angle is 109.35°. The framework of tetragonal analcime is topologically the same as the cubic modification.