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Lattice parameter determination of superlattices
Author(s) -
Berger H.,
Rosner B.,
Schikora D.
Publication year - 1989
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170240420
Subject(s) - superlattice , tetragonal crystal system , condensed matter physics , superposition principle , lattice (music) , trigonal crystal system , diffraction , lattice constant , materials science , reflection (computer programming) , optics , physics , chemistry , crystallography , crystal structure , quantum mechanics , programming language , computer science , acoustics
A method for determination of absolute lattice parameters of superlattices is described‐which does not use any relations to substrate reflections. For superlattices having tetragonal or trigonal symmetry, three parameters are to be determined. For this purpose, the diffraction angles of two reflections are measured, the third angle is obtained from the incidence angle difference of two single reflections of a “reflection group”. The peak shift caused by partial superposition of the single reflections, which occurs at larger superlattice periods, is corrected by means of simulation calculations. As an example, the results obtained on a PbTe/(Pb, Sn)Te superlattice are given and discussed.