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Properties of Silicon. EMIS Datareviews Series No. 4. Einführung: C. Hilsum, Vorwort: T. H. Ning, INSPEC, The Institution of Electrical Engineering, London, New York 1988, 31 Kapitel, 1100 Seiten, 260 Datareviews, £ 195, ISBN 0‐85296‐4757
Author(s) -
Balarin M.
Publication year - 1989
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170240410
Subject(s) - library science , citation , humanities , institution , engineering physics , engineering , computer science , philosophy , political science , law