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Comprehensive characterization of CdTe and (Cd, Zn)Te single crystals by a chemical etchant
Author(s) -
Wermke B.,
Mühlberg M.,
Engel A.,
Rudolph P.
Publication year - 1989
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170240405
Subject(s) - crystallography , cadmium telluride photovoltaics , isotropic etching , characterization (materials science) , etching (microfabrication) , materials science , lamellar structure , polarity (international relations) , single crystal , chemistry , nanotechnology , layer (electronics) , biochemistry , cell
Using a known chemical etchant low‐ and high angle boundaries and lamellar twins can be seen on CdTe and (Cd, Zn)Te crystal ingots as a whole as well as on slices with naked eyes. Also the polarity of {111} samples can be determined in this way. Etch pits are produced on cut and polished surfaces independent of their crystallographic orientation. A new modified etchant was used to study the low angle subgrain structure on (111)Te surfaces.