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I. C. Noyan, J. B. Cohen. Residual stress – measurement by diffraction and interpretation. Springer Series on Materials Research and Engineering, edited by B. Ilschner and N. J. Grant. Springer‐Verlag, New York‐Berlin‐Heidelberg‐London‐Paris‐Tokyo 1987, 276 Seiten, 160 Bilder, 31 Tabellen, DM 138. –, ISBN 3‐540‐96378‐2
Author(s) -
Klimanek P.
Publication year - 1989
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170240228
Subject(s) - interpretation (philosophy) , citation , library science , humanities , computer science , philosophy , programming language