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Influence of the structure of InP thin films on electron energy loss spectra
Author(s) -
Gründler R.,
Boudriot H.,
Deus K.,
Sckneider H. A.,
Stöckert T.
Publication year - 1989
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170240204
Subject(s) - crystallinity , crystallite , amorphous solid , thin film , materials science , spectral line , electron , plasmon , electron energy loss spectroscopy , condensed matter physics , crystallography , optoelectronics , chemistry , nanotechnology , composite material , transmission electron microscopy , physics , metallurgy , quantum mechanics , astronomy
Electron energy loss measurements were carried out on single crystalline, polycrystalline, and amorphous InP thin films. Plasmon data and structures of − Im ε −1 are discussed in dependence on degree of crystallinity.