Influence of the structure of InP thin films on electron energy loss spectra | Zendy

Gründler R. | Zendy; Boudriot H. | Zendy; Deus K. | Zendy; Sckneider H. A. | Zendy; Stöckert T. | Zendy

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Influence of the structure of InP thin films on electron energy loss spectra

Author(s) -

Gründler R.,

Boudriot H.,

Deus K.,

Sckneider H. A.,

Stöckert T.

Publication year - 1989

Publication title -

crystal research and technology

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.377

H-Index - 64

eISSN - 1521-4079

pISSN - 0232-1300

DOI - 10.1002/crat.2170240204

Subject(s) - crystallinity , crystallite , amorphous solid , thin film , materials science , spectral line , electron , plasmon , electron energy loss spectroscopy , condensed matter physics , crystallography , optoelectronics , chemistry , nanotechnology , composite material , transmission electron microscopy , physics , metallurgy , quantum mechanics , astronomy

Electron energy loss measurements were carried out on single crystalline, polycrystalline, and amorphous InP thin films. Plasmon data and structures of − Im ε −1 are discussed in dependence on degree of crystallinity.

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