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Thermoelectric power measurements of vacuum‐deposited SnO 2 /Sb 2 O 3 mixed thin films
Author(s) -
Kumar J. Siva,
Subba Rao U. V.
Publication year - 1988
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170231038
Subject(s) - thin film , seebeck coefficient , thermoelectric effect , materials science , vacuum evaporation , analytical chemistry (journal) , atmospheric temperature range , torr , evaporation , ultra high vacuum , thermoelectric materials , mineralogy , thermal conductivity , nanotechnology , composite material , chemistry , thermodynamics , physics , chromatography
Thin films of various thicknesses have been prepared from the powders of [SnO 2 + Sb 2 O 3 ] sample by the thermal evaporation technique in the vacuum of 10 −5 Torr. A jig which is convenient for the measurement of thermoelectric power on thin films in the temperature range from RT to 300 °C is designed and fabricated in our laboratory. Using the jig, thermoelectric power measurements have been made on thin films of [SnO 2 + Sb 2 O 3 ]. These results have shown that these thin films are n‐type in nature. The parameters like thermoactivation energy at 0 °C, temperature coefficient of activation energy, carrier concentration etc. have been calculated. The results thus obtained are presented and discussed in this paper.