Temperature variation of the phonon frequencies in V 3 Si along the [110] direction by the X‐ray inelastic scattering | Zendy

Sirota N. N. | Zendy; Poluchankina L. P. | Zendy; Orlova N. S. | Zendy

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Temperature variation of the phonon frequencies in V 3 Si along the [110] direction by the X‐ray inelastic scattering

Author(s) -

Sirota N. N.,

Poluchankina L. P.,

Orlova N. S.

Publication year - 1988

Publication title -

crystal research and technology

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.377

H-Index - 64

eISSN - 1521-4079

pISSN - 0232-1300

DOI - 10.1002/crat.2170230814

Subject(s) - phonon , scattering , condensed matter physics , inelastic scattering , dispersion (optics) , lattice (music) , intensity (physics) , x ray , vibration , inelastic neutron scattering , materials science , optics , atomic physics , physics , quantum mechanics , acoustics

The investigation of the intensity of X‐ray diffuse scattering by the lattice vibrations along the second‐order symmetry axis in V 3 Si single crystals is performed at different temperatures from 300 to 8 K and the phonon dispersion curves in this direction are determined. It is found that the phonon frequencies of all modes decrease with lowering temperature.

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