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Temperature variation of the phonon frequencies in V 3 Si along the [110] direction by the X‐ray inelastic scattering
Author(s) -
Sirota N. N.,
Poluchankina L. P.,
Orlova N. S.
Publication year - 1988
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170230814
Subject(s) - phonon , scattering , condensed matter physics , inelastic scattering , dispersion (optics) , lattice (music) , intensity (physics) , x ray , vibration , inelastic neutron scattering , materials science , optics , atomic physics , physics , quantum mechanics , acoustics
Abstract The investigation of the intensity of X‐ray diffuse scattering by the lattice vibrations along the second‐order symmetry axis in V 3 Si single crystals is performed at different temperatures from 300 to 8 K and the phonon dispersion curves in this direction are determined. It is found that the phonon frequencies of all modes decrease with lowering temperature.