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Microstrain and lattice parameter of pure and Li 2 O‐doped nickel oxide solid
Author(s) -
ElShabiny A. M.,
ElShobaky G. A.,
Hewaidy I. F.,
Ramadan A. A.
Publication year - 1988
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170230714
Subject(s) - crystallite , non blocking i/o , materials science , lattice constant , nickel oxide , doping , oxide , nickel , diffraction , thermal decomposition , lattice (music) , x ray crystallography , crystallography , analytical chemistry (journal) , chemistry , metallurgy , optics , organic chemistry , catalysis , physics , optoelectronics , acoustics
Abstract Pure and Li 2 O‐doped NiO were prepared by thermal decomposition of pure and LiOH‐treated Ni(OH) 2 at temperatures between 500 and 800 °C. The lattice parameter, residual microstrain and crystallite size were determined using X‐ray diffraction analyses.