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X‐ray diffraction in thick perfect crystals with deformed subsurface layers
Author(s) -
Bezirganyan P. H.,
Aboyan A. O.,
Tumasyan A. S.
Publication year - 1988
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170230710
Subject(s) - diffraction , scattering , crystal (programming language) , optics , harmonics , x ray crystallography , surface (topology) , perfect crystal , radiation , crystallography , materials science , physics , geometry , condensed matter physics , chemistry , mathematics , quantum mechanics , voltage , computer science , vacancy defect , programming language
The diffraction of X‐rays in thick perfect crystals with deformed subsurface layers has been investigated. It was shown that the kinematic scattering of X‐rays took place in deformed layers, while the dynamical one occurred in the perfect part of the crystal, ‐its bulk; also, that in beams of X‐rays diffracted on surface defects, the role played by the second harmonics of the applied characteristic radiation MoKα 1 was essential.