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Tilt angle measurements in S c phases by dielectric reorientation
Author(s) -
Pelzl G.
Publication year - 1988
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170230610
Subject(s) - tilt (camera) , dielectric , planar , materials science , dielectric function , optics , condensed matter physics , optoelectronics , geometry , physics , mathematics , computer graphics (images) , computer science
For 7 S C materials the tilt angle was measured as function of the temperature. The measurements were carried out by means of a new electrooptical method based on the dielectric reorientation of planar oriented samples.
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