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Structure refinement of paranatrolite by X‐ray diffraction
Author(s) -
Pechar F.
Publication year - 1988
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170230514
Subject(s) - monoclinic crystal system , orthorhombic crystal system , crystallography , tetrahedron , diffraction , hydrogen bond , x ray crystallography , ion , crystal structure , group (periodic table) , x ray , hydrogen , chemistry , materials science , molecule , physics , optics , organic chemistry
Paranatrolite, Na 2 Al 2 Si 3 O 10 ·3H 2 O, monoclinic (space group Cc), but described here the pseudo‐orthorhombic setting of Fd, with a = 18.998(3) Å, b = 19.018(3) Å, c = 6.579(2) Å, β = 90.37°(1) in analogy to scolecite. 225 parameters, including hydrogen atoms, were refined anisotropically from 1400 X‐ray diffraction reflections, the final conventional R ‐value being 0.036. Tetrahedral arrangement of Si and Al are of O—D character as well as the Na + ions. Hydrogen bonding is discussed.