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Sensivity of positron defect detection of surface layers
Author(s) -
Arifov P. U.,
Shevchenko A. V.
Publication year - 1988
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170230327
Subject(s) - positron , materials science , surface (topology) , physics , nuclear physics , geometry , mathematics , electron
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