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B. R. Pamplin †, P. Krishana (eds). Recent advances in X‐ray characterization of materials. Progress in Crystal Growth and Characterization, vol. 14. Pergamon Press, Oxford/New York/Beijing/Frankfurt/Sao Paulo/Sydney/Tokyo/Toronto 1987, 514 p., Bibliography, Subject and Compound Index. DM 300.—
Author(s) -
Schmitz W.
Publication year - 1987
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170221228
Subject(s) - characterization (materials science) , beijing , library science , humanities , history , art , nanotechnology , materials science , china , computer science , archaeology
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