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Positron trapping in deformed Gd
Author(s) -
del Río J.,
de Diego N.,
Hidalgo C.
Publication year - 1987
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170221222
Subject(s) - annealing (glass) , trapping , positron , doppler broadening , materials science , crystallography , condensed matter physics , atomic physics , chemistry , nuclear physics , physics , spectral line , metallurgy , electron , ecology , astronomy , biology
Positron lifetime and Doppler broadening measurements have been used to study the annealing behaviour of deformed Gd between 290 and 700 K. The observed recovery stage at about 370 K is attributed to dislocations annealing.
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