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Study of radiation damage on proton‐bombarded GaP by PIXE
Author(s) -
Ascheron C.,
Flagmeyer R.,
Otto G.,
Vogt J.,
Frey H. U.
Publication year - 1987
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170221212
Subject(s) - fluence , proton , radiation damage , rutherford backscattering spectrometry , materials science , radiation , irradiation , radiochemistry , mass spectrometry , analytical chemistry (journal) , particle (ecology) , chemistry , nuclear physics , physics , nanotechnology , geology , chromatography , thin film , oceanography
Abstract On GaP single crystals bombarded with 0.3 MeV and 1.0 MeV protons the fluence and depth dependences of radiation damage are studied by means of particle induced X‐ray emission spectrometry under chaneling conditions (PIXE‐C) and the Rutherford backscattering/channeling technique (RBS‐C). It is demonstrated that PIXE‐C is suitable to study depth profiles of damage density by the combination with the bevelling technique.