Premium
Precision measurement of lattice parameters in LiF monocrystals
Author(s) -
Dressler L.,
Griebner U.,
Kittner R.
Publication year - 1987
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170221116
Subject(s) - perpendicular , lattice (music) , crystal structure , lattice plane , condensed matter physics , materials science , crystal (programming language) , optics , surface (topology) , lattice constant , crystallography , geometry , chemistry , physics , diffraction , mathematics , reciprocal lattice , computer science , programming language , acoustics
The methodic possibilities of measurements by the Bond‐method for a highly precise determination of the lattice parameters in block structures with small block desorientation angles in the region of angular seconds or angular minutes (LiF crystals) have been examined. The lattice distorsion in two planes perpendicular to the (001) surface of crystalis described. The same planes have also been examined by elastooptic methods. In both planes we got for the lattice parameters: a 1 & a 2 > a 3 ( a 1 and a 2 parallel to the surface of crystal, a 3 perpendicular to the surface of crystal); i.e. we could observe a dilatation of the unit cell parallel to the surface of the crystal. Special results concerning the distribution of local lattice parameters along the surface of sample are discussed in connection with the results of elastooptic observations.