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Method for complex X‐ray diffraction analysis of TiN coatings
Author(s) -
Valvoda V.,
Černý R.,
Kužel R.,
Dobiášová L.
Publication year - 1987
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170221017
Subject(s) - tin , diffraction , crystallite , x ray crystallography , position (finance) , asymmetry , materials science , optics , x ray , intensity (physics) , crystallography , chemistry , metallurgy , physics , quantum mechanics , finance , economics
A complex of X‐ray diffraction methods for study of polycrystalline thin layers is presented. It is based on the approximation of measured profiles by suitable analytical functions. An application to TiN coatings prepared by PVD method on high‐speed steel is presented. The necessity to investigate several diffraction parameters (position, integral intensity, breadth, asymmetry) of more reflections is emphasized.