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Method of X‐ray spectral microanalysis of PbTe and SnTe obtained by the iodide method
Author(s) -
Assenov R.,
Moshnikov V. A.,
Patarov B.,
Yaskov D. A.
Publication year - 1987
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170221015
Subject(s) - microanalysis , iodide , x ray , analytical chemistry (journal) , spectral analysis , chemistry , intensity (physics) , radiant intensity , spectral line , materials science , optics , physics , inorganic chemistry , radiation , chromatography , organic chemistry , quantum mechanics , spectroscopy , astronomy
This an examination of the characteristics of the X‐ray spectral microanalysis of the tellurides of lead and thin, obtained by the iodide method. It was demonstrated that applying the method of calculating the composition in relation to the relative intensity of the characteristic X‐ray radiations of the analytical lines TeL α and IL α secures the possibility of analyzing relief surfaces. Besides that, the method makes it possible to make calculations without using numerous traditional semi‐empirical expressions under conditions of changes in the values of the accelerating voltage.