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X‐ray determination of the polarity of zincblende‐structure crystals
Author(s) -
Berger H.
Publication year - 1987
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170220817
Subject(s) - polarity (international relations) , diffraction , crystal (programming language) , crystallography , x ray crystallography , x ray , optics , materials science , chemistry , physics , computer science , biochemistry , cell , programming language
An X‐ray diffraction procedure for the determination of the polarity of noncentrosymmetric crystals by measuring the integrated reflections of opposite polarity on one surface of the crystal is described. The observed intensities must be corrected for the different asymmetries of the two reflections. To estimate the influence of crystal perfection on the correction factor, the ratios of the integrated reflections were calculated numerically for dynamic diffraction. The method has been applied for determining the polarity of CdTe.