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Simulation of contrasts in X‐ray plane wave topographs of quartz crystals with induced growth striations
Author(s) -
Härtwig J.,
Jäckel K.H.,
Lerche V.
Publication year - 1987
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170220715
Subject(s) - quartz , impurity , plane (geometry) , fourier transform , crystal (programming language) , x ray , optics , plane wave , materials science , crystal growth , physics , condensed matter physics , computational physics , geometry , mathematics , computer science , thermodynamics , quantum mechanics , composite material , programming language
Using system theoretical methods and fast discrete Fourier transforms, contrasts in plane wave topographs of crystals with impurity distributions of any form can be simulated with high accuracy and in a short time.