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Manfred Grasserbauer, Hans Joachim Dudek, Maria F. Ebel. Angewandte Oberflächenanalyse mit SIMS, AES und XPS. Akademieverlag Berlin, 1986, 300 Seiten, 152 Abb., 29 Tabellen, 198, – M, ISBN 3‐05‐500 059‐5
Author(s) -
Brümmer O.
Publication year - 1987
Publication title -
crystal research and technology
Language(s) - German
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170220615
Subject(s) - x ray photoelectron spectroscopy , humanities , art history , art , chemistry , materials science , physics , nuclear magnetic resonance
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