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Leonard C. Feldman, James W. Mayer. Fundamentals of surface and thin film analysis. North‐Holland, New York–Amsterdam–London, 1986, 352 Seiten, 175 Abb., 9 Tabellen im Anhang, ca. 150 Literaturzitate. ISBN 0‐444‐00989‐2. US $ 47.50/Dfl. 125.00. In the USA/Canada the book is available from Elsevier Sc. Publ. New York, N.Y. 10017
Author(s) -
Meisel A.
Publication year - 1987
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170220503
Subject(s) - citation , art history , humanities , engineering physics , art , library science , physics , computer science
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