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Application of X‐ray methods for the investigation of structural effects caused by high‐energy argon ions bombardment in silicon crystal
Author(s) -
Auleytner J.,
Furmanik Z.,
Gorecka J.
Publication year - 1987
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170220428
Subject(s) - chinese academy of sciences , engineering physics , physics , library science , chemistry , political science , computer science , law , china
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