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J. P. Fillard (ed.). Defect recognition and image processing in III‐V compounds. Proceedings of the International Symposium on Defect Recognition and Image Processing in III‐V Compounds, Montpellier, France, July 2–4, 1985. Elsevier, Amsterdam‐Oxford‐New York‐Tokyo 1985. VIII + 302 pages. US $ 84.50/Dfl. 245.00. In USA/Canada, the book is available from Elsevier Science, Publ. Co., New York, NY 10163, ISBN 0‐444‐42558‐0
Author(s) -
Paufler P.
Publication year - 1987
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170220405
Subject(s) - library science , citation , artificial intelligence , computer science