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The properties of application of the electron probe X‐ray microanalysis in the high‐temperature range particularly for the study of diffusion processes and phase formations
Author(s) -
Däbritz S.,
Ullrich H.J.,
Kleinstück K.
Publication year - 1987
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170220324
Subject(s) - electron microprobe , electron probe microanalysis , diffusion , microanalysis , characterization (materials science) , analytical chemistry (journal) , phase (matter) , atmospheric temperature range , electron , range (aeronautics) , chemistry , materials science , thermodynamics , mineralogy , nanotechnology , chromatography , physics , nuclear physics , organic chemistry , composite material
In this study the efficiency of a manufactored heating stage for the electron probe microanalyzer is presented and a methodology (High‐Temperature Electron Probe X‐Ray Micro Analysis, HT‐EPXMA seldom used till now for the determination of diffusion coefficients and activation energies, for the discovery, observation and characterization of phases in the heating‐up process as well as for the investigation of crystallographic parameters of phase transformations is obtained.