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Investigation of the Crystalline State of Identical Sample Domains by Means of Divergent X‐ray Beam Technique in the Direction of Transmission and Reflection in the Scanning Electron Microscope (SEM)
Author(s) -
Däbritz Siegfried,
Horn Herwig R.,
Kleinstück Karlheinz,
Waltinger Hanns,
Hoffmann Volker
Publication year - 1986
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170211211
Subject(s) - reflection (computer programming) , optics , scanning electron microscope , crystallite , microscope , transmission electron microscopy , sample (material) , materials science , conventional transmission electron microscope , beam (structure) , transmission (telecommunications) , x ray , cathode ray , scanning transmission electron microscopy , electron , chemistry , computer science , physics , metallurgy , telecommunications , chromatography , quantum mechanics , programming language
A supplementary device to a scanning electron microscope allows the simultaneous taking of wide‐angle interferences in the directions of transmission and back reflection of identical specimen areas. A developed computer program simulates the complete reflex system so that the identity with the pattern is obtained. This results, on the one hand, in qualitative and quantitative statements concerning the real structure of the specimen and, on the other hand, shadings of reflexes caused by the target holder tube can be distinguished from interruptions of reflexes caused by the grain size effects. The efficiency of the supplementary device for the characterizing of mono‐ and polycrystalline specimens is demonstrated by several examples.