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Peculiarities in the X‐ray Spectral Microanalysis of the SnTeI System
Author(s) -
Assenov R.,
Moshnikov V.,
Patarov B.,
Yaskov D.
Publication year - 1986
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170211121
Subject(s) - microanalysis , fortran , microprobe , electron microprobe , ternary operation , binary number , electron probe microanalysis , analytical chemistry (journal) , chemistry , mineralogy , computer science , mathematics , arithmetic , organic chemistry , chromatography , programming language , operating system
This is an examination of the methodological specificities of the roentgenospectral microanalysis of the SnTeI system, involving the application of a graphoanalytical method used in the analysis of ternary systems according to data calculated for the binary ones. The calculations were made on an ES 1060 computer in FORTRAN‐4. The calculations are for different selection angles of the microanalyzer, and for a broad interval of values of the accelerating voltage. In this manner the method offered is applicable to any type of microanalyzer, and not only to the Cameca MS‐46 used by us.