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Heights of Overlapping X‐ray Reflections and Phase Analysis
Author(s) -
Valvoda V.
Publication year - 1986
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170210715
Subject(s) - diffractometer , maxima , phase (matter) , x ray , crystallography , x ray crystallography , optics , materials science , physics , geometry , computational physics , mathematics , chemistry , diffraction , quantum mechanics , crystal structure , art , performance art , art history
The influence of reflections overlapping on the heights of their maxima is investigated using the Lorentzian profile approximation. This influence should be taken into account in automatic powder diffractometer programs of phase analysis based on the peak heights.