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Etch Pattern of Gel‐grown Single Crystal of Ammonium Tartrate
Author(s) -
Saraf A. G.,
Saraf K. B.,
Wani P. A.
Publication year - 1986
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170210310
Subject(s) - ammonium hydroxide , oxalic acid , etching (microfabrication) , crystal (programming language) , sodium hydroxide , tartrate , crystallography , materials science , etch pit density , ammonium oxalate , chemistry , nanotechnology , inorganic chemistry , organic chemistry , layer (electronics) , computer science , programming language
Abstract Using optical techniques, a study was carried out of the etch patterns produced, by diluted oxalic acid and sodium hydroxide solution, at 30°C. Point bottomed and flat bottomed rectangular etch pits nucleated at the sites of dislocations parallel to ‘C’ axis of the crystal are observed. Mostly they are isolated, and randomly distributed. Further, on prolonged etching they penetrate deeper and their eccentricity can be attributed to the inclined nature of dislocations.