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Peak Position Determination of X‐Ray Diffraction Profiles in Precision Lattice Parameter Measurements According to the Bond‐Method with Help of the Polynomial Approximation
Author(s) -
Grosswig S.,
Jäckel K.H.,
Kittner R.
Publication year - 1986
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170210132
Subject(s) - position (finance) , lattice (music) , diffraction , polynomial , lattice constant , reciprocal lattice , reciprocal , convergence (economics) , mathematics , mathematical analysis , physics , optics , linguistics , philosophy , finance , acoustics , economics , economic growth
The possibilities and limits of the polynomial approximation for an accurate determination of the peak position of X‐ray diffraction profiles in precision lattice parameter measurements according to the BOND‐method are investigated. The use of a polynomial approximation with reciprocal measuring values leads to an improvement of the convergence properties of the approximation and allows to use polynomials with lower degree. A practicable criterion of the choise of optimum approximation parameters is given. It is shown that the accuracy of the determination of the peak position which is needed for precision lattice parameter measurements with an accuracy of about Δ d / d ≈ 10 −7 is attainable under usual experimental conditions.