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Problems and results of diffusion length investigations by energy‐dependent EBIC measurements
Author(s) -
Kittler M.,
Seifert W.,
Schröder K.W.,
Susi E.
Publication year - 1985
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170201103
Subject(s) - diffusion , bevel , materials science , yield (engineering) , composite material , thermodynamics , physics , structural engineering , engineering
The fundamentals of the method are described. From applications of this measuring method the following results were obtained: The determination of the diffusion length on glass‐plate bevels with evaporated Schottky contacts is frequently quite difficult and sometimes even impossible. Besides a reduction of the diffusion length with increasing microdefect density surprisingly also the opposite behaviour can be found. Comparative PEM and EBIC investigations yield differences between both diffusion lengths ( L EBIC < < L PEM ) depending on the sample pre‐history.