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Microhardness studies on some compound semiconductors
Author(s) -
Nagabhooshanam M.,
Babu V. Hari
Publication year - 1985
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170201016
Subject(s) - indentation hardness , semiconductor , materials science , vickers hardness test , melting point , composite material , metallurgy , mineralogy , chemistry , microstructure , optoelectronics
Vickers microhardness studies on some III–V and II–VI compound semiconductors have been made. The results showed that ZnS has the highest microhardness value. These results are compared with other properties of the crystals such as melting point, ionicity etc. Variation of microhardness with load was also studied on all the crystals. The results indicated that the hardness value increases at low loads. These results have been analysed by using resistance pressure model and interpreted.