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TEM and X‐ray investigations of defect structure of PbSnTe crystal
Author(s) -
Morawiec J.,
Auleytner J.,
Furmanik Z.,
Jȩdrzejczak A.
Publication year - 1985
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170200713
Subject(s) - burgers vector , dislocation , crystallography , materials science , reflection (computer programming) , crystal (programming language) , tilt (camera) , single crystal , condensed matter physics , x ray , optics , geometry , chemistry , physics , mathematics , computer science , programming language
The Pb 0.8 Sn 0.2 Te single crystal grown by the Bridgman technique was examined by X‐ray and TEM methods. The X‐ray reflection topography revealed that the PbSnTe crystal consisted of monocrystallinic blocks with linear dimensions of 1–5 mm separated by low angle boundaries of tilt‐twist character. “As grown” defects observed by TEM method have been identified as single perfect dislocations and dislocation pairs. A mean density of dislocations inside the crystal blocks was no more than 10 3 cm −2 . Except “as grown” defects rows of mobile dislocations were observed. All of dislocations lines were characterized by the same type of Burgers vector, i.e. b = 1/2 a 〈110〉.