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H. Oechsner (ed.): Thin film and depth profile analysis. (erschienen in der Reihe Topics in Current Physics; 37). Springer‐verlag Berlin, Heidelberg, New York, Tokyo, 1984 205 seiten, 99 abbildungen. Preis: DM 72. — ISBN 3–540–13320–8
Author(s) -
Streubel P.
Publication year - 1985
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170200638
Subject(s) - citation , library science , physics , engineering physics , humanities , art history , computer science , philosophy , history
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