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Explicit errors of thickness and refractive index from ellipsometrical measurements
Author(s) -
Löschke K.
Publication year - 1985
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170200325
Subject(s) - index (typography) , citation , philosophy , physics , computer science , library science , world wide web