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Diffuse X‐ray scattering study of the temperature variation of elastic constants in indium arsenide
Author(s) -
Orlova N. S.
Publication year - 1985
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170200220
Subject(s) - indium arsenide , atmospheric temperature range , indium , gallium arsenide , elastic scattering , range (aeronautics) , scattering , materials science , x ray , thermal expansion , chemistry , analytical chemistry (journal) , condensed matter physics , optics , thermodynamics , optoelectronics , physics , composite material , chromatography
The elastic constants of indium arsenide have been determined in the temperature range from 80 to 750 K on n‐type samples with a carrier concentration of about 8 · 10 17 cm −3 by Wooster's method from the measurements of the thermal X‐ray diffuse scattering intensities. An average decrease in the elastic constants with increasing temperature over the above mentioned temperature range is found to be about 8%.