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DC breakdown studies on CeO 2 films
Author(s) -
Chandra Shekar M.,
Hari Babu V.
Publication year - 1984
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170191125
Subject(s) - breakdown voltage , electrical breakdown , materials science , capacitor , electric breakdown , optical microscope , thin film , film capacitor , optoelectronics , voltage , composite material , nanotechnology , scanning electron microscope , electrical engineering , dielectric , engineering
The electrical breakdown studies were made on Al—CeO 2 —Al thin film capacitors using dc voltage. The optical photomicrographs of the breakdown patterns were obtained at several stages of breakdown using universal optical microscope. Breakdown patterns seems to be originated at some inhomogeneity which may cause to form single‐hole breakdown and is followed by propagating mechanism. The results were discussed.