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Peculiarities of the cross‐section in chemically prepared SnO 2 ‐ and SnO 2 :Sb layers
Author(s) -
Dogil B.,
Froissart F.,
Horodecki A. J.,
Precht W.
Publication year - 1984
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170191108
Subject(s) - tin , tin dioxide , materials science , doping , electron microscope , cross section (physics) , crystallography , chemistry , nanotechnology , chemical engineering , mineralogy , metallurgy , optics , physics , optoelectronics , quantum mechanics , engineering
Layers of pure as well as Sb‐doped tin dioxide have been prepared using intentionally simple modification of CVD technique. By electron microscopy of cross‐section, at least two sublayers have been observed in samples of thickness of a few micrometers in both of the cases. Their formation is thought to be associated with small perturbation of thermodynamical equilibrium arising due to the layer growth.