Apparent threshold characteristics of pretilted nematic layers | Zendy

Hauck G. | Zendy; Koswig H. D. | Zendy

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Apparent threshold characteristics of pretilted nematic layers

Author(s) -

Hauck G.,

Koswig H. D.

Publication year - 1984

Publication title -

crystal research and technology

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.377

H-Index - 64

eISSN - 1521-4079

pISSN - 0232-1300

DOI - 10.1002/crat.2170190824

Subject(s) - liquid crystal , threshold voltage , materials science , deformation (meteorology) , voltage , condensed matter physics , optics , physics , composite material , optoelectronics , transistor , quantum mechanics

The influence of pretilt angles on the voltage dependence of the transmission of nematic liquid crystal cells has been investigated. A conception of an apparent threshold voltage and voltages of other selected deformation states characterized by a parameter A has been introduced. The dependence of the apparent threshold voltage on the pretilt angle is shown in experimental curves. An analytical expression of this dependence could be derived starting from a mean deformation angle.

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