A curved‐crystal spectrometer for soft X‐ray emission studies of metals and metallic alloys | Zendy

Zschech E. | Zendy; Wehner B. | Zendy; Kleinstück K. | Zendy; Blau W. | Zendy; Dick M. | Zendy; Förster E. | Zendy

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A curved‐crystal spectrometer for soft X‐ray emission studies of metals and metallic alloys

Author(s) -

Zschech E.,

Wehner B.,

Kleinstück K.,

Blau W.,

Dick M.,

Förster E.

Publication year - 1984

Publication title -

crystal research and technology

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.377

H-Index - 64

eISSN - 1521-4079

pISSN - 0232-1300

DOI - 10.1002/crat.2170190726

Subject(s) - spectrometer , bent molecular geometry , crystal (programming language) , emission spectrum , spectral line , materials science , x ray spectroscopy , x ray , single crystal , resolution (logic) , optics , physics , chemistry , crystallography , spectroscopy , quantum mechanics , astronomy , artificial intelligence , computer science , composite material , programming language

Quantitative comparisons between obtained X‐ray emission spectra of 3d‐transition metal elements and their alloys as well as band structure calculations demand an energetic resolution of the order of E ≈ 1 eV. A highly resolving focussing X‐ray spectrometer is described which allows very high quality X‐ray emission spectra to be obtained. The spectrometer utilizes a spherically bent Si(111)‐crystal operated on the Rowland circle. The selection, fabrication and testing of the crystal are described. A comparison between own measurements of line‐width of Co‐Kα 1,2 ‐ and Cu‐Kα 1,2 ‐emission lines as well as literature values is given. The required energetic resolution can be obtained in the upper range of the Bragg angle δ with the described X‐ray spectrometer and a spherically bent crystal.

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