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Dislocation behaviour in annealed and aged LiF crystals
Author(s) -
Ostapchuk E. I.
Publication year - 1984
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170190718
Subject(s) - annealing (glass) , materials science , dislocation , condensed matter physics , diffusion , crystallography , czochralski method , composite material , thermodynamics , metallurgy , chemistry , silicon , physics
Abstract Parallel investigation of the magnitude of the critical strear stress τ 0 and dynamic characteristics of individual screw dislocations at temperatures 4.2, 77, and 300 K has been carried out in LiF crystals after annealing and after long aging at room temperature. It has been established that in impure LiF crystals, even at such low temperatures as room temperature (0.25 T melt ), diffusion processes take place which lead to quantitative and qualitative changes of the structure of obstacles determining macroscopic and microscopic mechanical properties.