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Some crystallographic trends into the Na 1+ x Zr 2 Si x P 3‐ x O 12 System
Author(s) -
Krajewski A.,
Valmori R.,
Fiegna A.
Publication year - 1984
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170190705
Subject(s) - isostructural , stoichiometry , crystallography , diffraction , unit (ring theory) , characterization (materials science) , materials science , chemistry , x ray crystallography , crystal structure , physics , mathematics , nanotechnology , optics , mathematics education
This paper gives a contribution to the crystallographic characterization of the Na 1+ x Zr 2 Si x P 3‐ x O 12 system, useful e.g. to analyze the right stoichiometric composition of a synthesized sample concerning this family of compounds, by powders X‐ray diffraction analysis. In the paper relations are in fact displayed to exist among d hkl , unit cell parameters and the stoichiometric parameter x . Such relations show to be linear for d hkl and a 0 , while the relation trend involving c 0 let one think the system is isostructural in the atomic arrangement for the ranges x < 2 and x <2, respectively, to the end terms with x =0 and x =3.