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Determination of the bending radius and diffraction profile parameters for X‐Ray Analyzer Crystals with X‐ray parallel beam
Author(s) -
Kogan M. T.,
Shechtman V. M.
Publication year - 1984
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170190427
Subject(s) - bent molecular geometry , diffraction , radius , optics , crystal (programming language) , bending , beam (structure) , rotation (mathematics) , spectrum analyzer , materials science , uniaxial crystal , bend radius , x ray , physics , geometry , optical axis , mathematics , computer security , lens (geology) , composite material , programming language , computer science
A technique is proposed based upon angular scanning of a bent crystal shifted from the rotation axis. The axis‐to‐crystal distance providing the maximum reflecting efficiency is used to determine the bending radius of reflecting planes, and the diffraction profile can be obtained using an efficiency variation with a crystal shift tangential to Rowland circle at front focus. A rocking curve plotted — a “topogram” of the crystal surface is used to measure its reflecting area and a regularity of bending. The technique is suitable for various types of analyzers in both the reflecting and transmitting arrangements. Instrumental conditions are defined and some experimental examples are given.