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X‐Ray study of the defect structure of PbTe single crystals
Author(s) -
Berger H.,
Mizera E.,
Auleytner J.
Publication year - 1984
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170190110
Subject(s) - substructure , materials science , dislocation , crystallography , slip (aerodynamics) , dopant , single crystal , condensed matter physics , composite material , chemistry , optoelectronics , doping , thermodynamics , physics , structural engineering , engineering
PbTe single crystals grown by different methods were thinned electrolytically and examined by X‐ray transmission topography. The transmission topographs, first obtained of this material, reveal substructure, slip lines and single dislocations. The samples exhibit different structural perfection in dependence on the growth method. In crystals of relatively high perfection, slip lines are the striking feature of defect structure, caused by surface damage during mechanical preparation. The most perfect sample has a dislocation density of 10 2 to 2 ṁ 10 3 cm −2 . No slip occurs, probably due to small dopant contents.