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X‐ray double crystal diffractometer for testing of plane analyser crystals of LiF
Author(s) -
Dressler L.,
Wehrhan O.
Publication year - 1983
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170181229
Subject(s) - diffractometer , analyser , crystal (programming language) , materials science , cleavage (geology) , reflection (computer programming) , optics , crystallography , crystal structure , chemistry , physics , composite material , computer science , programming language , fracture (geology)
A double crystal diffractometer (DCD) for testing LiF crystals is presented. It is possible to distinguish in a relatively short measuring time (nearly 10 minutes including change of sample and adjustment) between crystals with block desorientation angles >1′ and ≦ 1′ (1′ = 0.291 · 10 −3 rad). The extention of area registered during a measurement depends on the kind of section of crystal and the kind of reflection; at the examination of {100}‐cleavage faces of LiF an elliptical area of a height of 15 mm and a length of 115 mm is registered.