X‐ray double crystal diffractometer for testing of plane analyser crystals of LiF | Zendy

Dressler L. | Zendy; Wehrhan O. | Zendy

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X‐ray double crystal diffractometer for testing of plane analyser crystals of LiF

Author(s) -

Dressler L.,

Wehrhan O.

Publication year - 1983

Publication title -

crystal research and technology

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.377

H-Index - 64

eISSN - 1521-4079

pISSN - 0232-1300

DOI - 10.1002/crat.2170181229

Subject(s) - diffractometer , analyser , crystal (programming language) , materials science , cleavage (geology) , reflection (computer programming) , optics , crystallography , crystal structure , chemistry , physics , composite material , computer science , programming language , fracture (geology)

A double crystal diffractometer (DCD) for testing LiF crystals is presented. It is possible to distinguish in a relatively short measuring time (nearly 10 minutes including change of sample and adjustment) between crystals with block desorientation angles >1′ and ≦ 1′ (1′ = 0.291 · 10 −3 rad). The extention of area registered during a measurement depends on the kind of section of crystal and the kind of reflection; at the examination of {100}‐cleavage faces of LiF an elliptical area of a height of 15 mm and a length of 115 mm is registered.

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