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Increase of sensibility of X‐ray diffraction technique for investigation of quartz monocrystal perfection
Author(s) -
Zargaryan Y. G.,
Bezirganyan P. H.,
Adamyan S. A.
Publication year - 1983
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170181116
Subject(s) - quartz , sensibility , diffraction , x ray , materials science , optics , composite material , physics , art , literature
It is shown that for the increase of sensibility of X‐ray topogram methods to investigate the slantwise cut quartz monocrystal, the external electrostatic field of a certain magnitude should be applied on the sample.