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C. R. Tellier, A. J. Tosser. Size effects in thin films. aus der Reihe „Thin Films Science and Technology”︁, Vol. 2 (Editor: G. Siddall). Elsevier Scientific Publishing Company, Amsterdam‐Oxford‐New York 1982, 310 Seiten mit 102 Abbildungen, 19 Tabellen und 428 Literaturzitaten, Preis: US $ 74.50 bzw. Dfl. 160.00
Author(s) -
Neumann H.
Publication year - 1983
Publication title -
crystal research and technology
Language(s) - German
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170181108
Subject(s) - scientific publishing , publishing , von neumann architecture , library science , citation , engineering physics , humanities , computer science , physics , philosophy , political science , law , operating system

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